IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting

Author(s): Wenting Jiao ; Ke You ; Junqiang Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2019
Volume: 11
Page(s): 1 - 12
ISSN (CD): 1943-0647
ISSN (Electronic): 1943-0655
DOI: 10.1109/JPHOT.2019.2897332
Regular:

A multiple microwave frequency measurement is experimentally demonstrated by exploiting stimulated Brillouin scattering and nonlinear fitting. Through sweeping a reference frequency during the... View More

Advertisement