IEEE - Institute of Electrical and Electronics Engineers, Inc. - Monitoring the Etching Process of Hi-Bi Fiber Through a Fiber Loop Mirror

Author(s): Danling Wu ; Jun Zhu ; Hui Wang ; Benli Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2017
Volume: 9
Page(s): 1 - 8
ISSN (CD): 1943-0647
ISSN (Electronic): 1943-0655
DOI: 10.1109/JPHOT.2017.2760889
Regular:

A method for monitoring the etching process of Hi-Bi fiber is proposed and demonstrated. The birefringence of the etching fiber is accurately calculated by tracking the shift of the interference... View More

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