IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Author(s): Byung-Chang Yu ; Jongbin Kim ; Seung-Hyuck Lee ; Hoon-Ju Chung ; Seung-Woo Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 315 - 321
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2018.2885529
Regular:

This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of... View More

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