IEEE - Institute of Electrical and Electronics Engineers, Inc. - Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions

Author(s): Philip G. Neudeck ; Liangyu Chen ; Roger D. Meredith ; Dorothy Lukco ; David J. Spry ; Leah M. Nakley ; Gary W. Hunter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 100 - 110
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2018.2882693
Regular:

Prolonged Venus surface missions (lasting months instead of hours) have proven infeasible to date in the absence of a complete suite of electronics able to function for such durations without... View More

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