IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Interface States on Ge-On-SOI Photodiodes

Author(s): Chong Li ; Ben Li ; Shihong Qin ; Jiale Su ; Xiaoying He ; Xia Guo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 7 - 12
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2018.2872037
Regular:

The 4.2% mismatch at the Si/Ge interface has a significant impact on Si/Ge photodetectors. However, few researchers have attempted to determine the major noise source or study the effects of the... View More

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