IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scaling Down Effect on Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors

Author(s): Yuan Liu ; Shu-Ting Cai ; Chao-Yang Han ; Ya-Yi Chen ; Li Wang ; Xiao-Ming Xiong ; Rongsheng Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 203 - 209
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2018.2890737
Regular:

Scaling down effects on conduction and low frequency noise characteristics are investigated in a set of p-type polycrystalline silicon thin-film transistors (poly-Si TFTs) with fixed channel width... View More

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