IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quantitative TLP Waveform Analysis for GGNmosts

Author(s): Gijs J. De Raad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2018
Volume: 6
Page(s): 1,097 - 1,114
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2018.2866683
Regular:

A method to extract internal physical quantities from transmission line pulse (TLP) waveforms of grounded gate nMOS electro-static discharge protections is presented. The extraction method is... View More

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