IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays

Author(s): Alessandro Grossi ; Cristian Zambelli ; Piero Olivo ; Paolo Pellati ; Michele Ramponi ; Christian Wenger ; Jeremy Alvarez-Herault ; Ken Mackay
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Volume: 6
Page(s): 269 - 277
ISSN (CD): 2376-4562
ISSN (Electronic): 2168-6750
DOI: 10.1109/TETC.2016.2585043
Regular:

In this paper it is presented a test equipment for the characterization of two different emerging memory technologies like the Thermally Assisted Switching-Magnetic Random Access Memory (TASMRAM)... View More

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