IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scan-Chain Intra-Cell Aware Testing

Author(s): Aymen Touati ; Alberto Bosio ; Patrick Girard ; Arnaud Virazel ; Paolo Bernardi ; Matteo Sonza Reorda ; Etienne Auvray
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Volume: 6
Page(s): 278 - 287
ISSN (CD): 2376-4562
ISSN (Electronic): 2168-6750
DOI: 10.1109/TETC.2016.2624311
Regular:

This paper first presents an evaluation of the effectiveness of different test pattern sets in terms of ability to detect possible intra-cell defects affecting the scan flip-flops. The analysis is... View More

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