IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method

Author(s): Tao Chen ; Chulhyun Park ; Shravan K. Chaganti ; Jose Silva-Martinez ; Randall L. Geiger ; Degang Chen
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2907035
Regular:

A novel ultrafast and low-cost pipelined analog-to-digital converter (ADC) testing and calibration method is proposed. The ADC nonlinearities are modeled as segmented parameters with interstage... View More

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