IEEE - Institute of Electrical and Electronics Engineers, Inc. - Patchmatch-Based Robust Stereo Matching Under Radiometric Changes

Author(s): Jaeseung Lim ; Sankeun Lee
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2019
Volume: 41
Page(s): 1,203 - 1,212
ISSN (CD): 2160-9292
ISSN (Electronic): 1939-3539
ISSN (Paper): 0162-8828
DOI: 10.1109/TPAMI.2018.2819662
Regular:

In the real world, the two challenges of stereo vision system include a robust system under various radiometric changes and real-time process. To extract depth information from stereoscopic... View More

Advertisement