IEEE - Institute of Electrical and Electronics Engineers, Inc. - Patchmatch-Based Robust Stereo Matching Under Radiometric Changes
Author(s): | Jaeseung Lim ; Sankeun Lee |
Sponsor(s): | IEEE Computer Society |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 May 2019 |
Volume: | 41 |
Page(s): | 1,203 - 1,212 |
ISSN (CD): | 2160-9292 |
ISSN (Electronic): | 1939-3539 |
ISSN (Paper): | 0162-8828 |
DOI: | 10.1109/TPAMI.2018.2819662 |
Regular:
In the real world, the two challenges of stereo vision system include a robust system under various radiometric changes and real-time process. To extract depth information from stereoscopic... View More