IEEE - Institute of Electrical and Electronics Engineers, Inc. - A model for multi-view ultrasonic array inspection of small two-dimensional defects

Author(s): Nicolas Budyn ; Rhodri L. T. Bevan ; Jie Zhang ; Anthony J. Croxford ; Paul D. Wilcox
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1525-8955
ISSN (Paper): 0885-3010
DOI: 10.1109/TUFFC.2019.2909988
Regular:

The multi-view total focusing method (TFM) is an imaging algorithm for ultrasonic full matrix array data that exploits internal reflections and mode conversions in the inspected object to create... View More

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