IEEE - Institute of Electrical and Electronics Engineers, Inc. - BadNets: Evaluating Backdooring Attacks on Deep Neural Networks

Author(s): Tianyu Gu ; Kang Liu ; Brendan Dolan-Gavitt ; Siddharth Garg
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2909068
Regular:

Deep learning-based techniques have achieved state-of-the-art performance on a wide variety of recognition and classification tasks. However, these networks are typically computationally expensive... View More

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