IEEE - Institute of Electrical and Electronics Engineers, Inc. - 3D Profilometry With a Self-Mixing Interferometer: Analysis of the Speckle Error

Author(s): Silvano Donati ; Giuseppe Martini
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Volume: 31
Page(s): 545 - 548
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2019.2901274
Regular:

We show that the speckle phase error incurred when the laser spot is scanned over the diffusing surface can be made as low as 10-20 μm for object sizes in the range 3-10 cm. This result is... View More

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