IEEE - Institute of Electrical and Electronics Engineers, Inc. - Corrupted Reference Image Quality Assessment of Denoised Images

Author(s): Chen Zhang ; Wu Cheng ; Keigo Hirakawa
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Volume: 28
Page(s): 1,732 - 1,747
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2878326
Regular:

We propose corrupted reference image quality assessment (CRIQA), a novel foundation for reasoning about image quality and image denoising problems jointly. In order to assess the visual quality of... View More

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