IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spontaneous Degradation of Flexible Poly-Si TFTs Subject to Dynamic Bending Stress

Author(s): Wei Jiang ; Mingxiang Wang ; Huaisheng Wang ; Dongli Zhang
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 5
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2019.2907042
Regular:

An abnormal spontaneous degradation of polycrystalline Si thin-film transistors (TFTs) subject to dynamic bending stress is reported. Dynamic mechanical bending along either the channel-width or... View More

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