IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Reliability Function of Distributed Hypothesis Testing Under Optimal Detection

Author(s): Nir Weinberger ; Yuval Kochman
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9654
ISSN (Paper): 0018-9448
DOI: 10.1109/TIT.2019.2910065
Regular:

The distributed hypothesis testing problem with full side-information is studied. The trade-off (reliability function) between the two types of error exponents under limited rate is studied in the... View More

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