IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Aperture Diameter on Image Blur of CMOS Image Sensor With Pixel Apertures

Author(s): Byoung-Soo Choi ; Sang-Hwan Kim ; Jimin Lee ; Donghyun Seong ; Jewon Lee ; Junwoo Lee ; Seunghyuk Chang ; JongHo Park ; Sang-Jin Lee ; Jang-Kyoo Shin
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 7
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2905708
Regular:

This paper presents the effects of aperture diameter on image blur of complementary metal-oxide-semiconductor (CMOS) image sensor with pixel apertures for depth extraction. In a... View More

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