IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks

Author(s): Matthias Demant ; Patrick Virtue ; Aditya Kovvali ; Stella X. Yu ; Stefan Rein
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 9
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2906036
Regular:

This paper investigates deep convolutional neural networks (CNNs) for the assessment of defects in multicrystalline silicon (mc-Si) and high-performance mc-Si wafers for solar cell production... View More

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