IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model

Author(s): Ahcene Bounceur ; Salvador Mir ; Reinhardt Euler ; Kamel Beznia
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1937-4151
ISSN (Paper): 0278-0070
DOI: 10.1109/TCAD.2019.2907923
Regular:

Analog/RF built-in test (BIT) techniques are essential for reducing the very high costs of specification-based tests and for high-safety applications. The adoption of a BIT technique needs to be... View More

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