IEEE - Institute of Electrical and Electronics Engineers, Inc. - Falls Risk Classification of Older Adults Using Deep Neural Networks and Transfer Learning

Author(s): Matthew Thomas Martinez ; Phillip De Leon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2168-2208
ISSN (Paper): 2168-2194
DOI: 10.1109/JBHI.2019.2906499
Regular:

Prior research in falls risk classification using inertial sensors has relied on the use of engineered features, which has resulted in a feature space containing hundreds of features that are... View More

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