IEEE - Institute of Electrical and Electronics Engineers, Inc. - Weakly Supervised Deep Learning for Brain Disease Prognosis Using MRI and Incomplete Clinical Scores

Author(s): Mingxia Liu ; Jun Zhang ; Chunfeng Lian ; Dinggang Shen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Electronic): 2168-2275
ISSN (Paper): 2168-2267
DOI: 10.1109/TCYB.2019.2904186
Regular:

As a hot topic in brain disease prognosis, predicting clinical measures of subjects based on brain magnetic resonance imaging (MRI) data helps to assess the stage of pathology and predict future... View More

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