IEEE - Institute of Electrical and Electronics Engineers, Inc. - Laser-induced damage on fused silica with photo-acoustic spectrum analysis

Author(s): Kejun Chen ; Muyu Yi ; Fan Gao ; Xiang Zhang ; Xiao Yuan
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2019.2908004
Regular:

Laser-induced damage on fused silica is studied with photo-acoustic spectrum. The damage characteristics are evaluated with the spectral analysis of photo-acoustic signal. Experimental results... View More

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