IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contribution of Quantum Susceptance in SIS Junction Capacitance Measurement

Author(s): Takafumi Kojima ; Matthias Kroug ; Yoshinori Uzawa ; Yuto Kozuki ; Wenlei Shan
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2378-7074
ISSN (Electronic): 1558-2515
ISSN (Paper): 1051-8223
DOI: 10.1109/TASC.2019.2908092
Regular:

In this paper, we present an investigation of the contribution of quantum susceptance in capacitance measurements of superconductor-insulator-superconductor tunnel junctions. We directly... View More

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