IEEE - Institute of Electrical and Electronics Engineers, Inc. - Event-Triggered Fault Detection and Isolation of Discrete-Time Systems Based on Geometric Technique

Author(s): Hongjing Liang ; Zhenxing Zhang ; Choon Ki Ahn
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-3791
ISSN (Paper): 1549-7747
DOI: 10.1109/TCSII.2019.2907706
Regular:

This paper considers the problem of fault detection and isolation using the geometric approach for discrete-time systems. The description of unobservable subspace is presented. The residuals are... View More

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