IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mutant Quality Indicators

2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Author(s): Mike Papadakis ; Thierry Titcheu Chekam ; Yves Le Traon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Conference Location: Vasteras, Sweden
Conference Date: 9 April 2018
Page(s): 32 - 39
ISBN (Electronic): 978-1-5386-6352-3
DOI: 10.1109/ICSTW.2018.00025
Regular:

The question of which are the valuable mutants has received little attention in mutation testing literature. Naturally, the choice of mutants impacts the quality of the performed analysis and has... View More

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