IEEE - Institute of Electrical and Electronics Engineers, Inc. - Smart Happiness Meter

2018 International Conference on Signal Processing and Information Security (ICSPIS)

Author(s): Nadiya Dilshad ; Kamarul Faizal Bin Hashim ; Sami Miniaoui ; Shadi Atalla
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Conference Location: DUBAI, United Arab Emirates, United Arab Emirates
Conference Date: 7 November 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-7281-0257-3
ISBN (USB): 978-1-7281-0258-0
DOI: 10.1109/CSPIS.2018.8642717
Regular:

The main objective of this paper is to discuss the implementation of a Smart Happiness Meter (SHM) prototype that adopts a face detection and recognition approach to provide a real-time statistic... View More

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