IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simulation-based method for estimating defect-free I/sub DDQ/

Digest of Papers IEEE International Workshop on IDDQ Testing

Author(s): Maxwell, P.C. ; Rearick, J.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 5 November 1997
Page(s): 80 - 84
ISBN (Paper): 0-8186-8123-3
DOI: 10.1109/IDDQ.1997.633018
Regular:

This paper presents a switch-level simulation-based method for estimating quiescent current values. The simulator identifier transistors that are in the proper state to experience leakage... View More

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