IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Representations with Local and Global Geometries Preserved for Machine Fault Diagnosis

Author(s): Yue Li ; Chamara Kasun Liyanaarachchi Lekamalage ; Tianchi Liu ; Pinan Chen ; Guang-Bin Huang
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9948
ISSN (Paper): 0278-0046
DOI: 10.1109/TIE.2019.2905830
Regular:

Recently, deep learning based representation learning methods have attracted increasing attention in machine fault diagnosis. However, few existing methods consider the geometry of data samples.... View More

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