IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Low-Frequency Noise Characterization of Z2-FET Devices

Author(s): Carlos Marquez ; Carlos Navarro ; Santiago Navarro ; Jose L. Padilla ; Luca Donetti ; Carlos Sampedro ; Philippe Galy ; Yong-Tae Kim ; Francisco Gamiz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2907062
Regular:

This work addresses the low frequency noise characterization of Z2-FET structures. These double-gated p-i-n diode devices have been fabricated at STMicroelectronics in an ultrathin body and box... View More

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