IEEE - Institute of Electrical and Electronics Engineers, Inc. - Degradation Data Analysis Using a Wiener Degradation Model With Three-source Uncertainties

Author(s): Donghui Pan ; Siliang Lu ; Yongbin Liu ; Wenzhi Yang ; Jia-Bao Liua
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2906325
Regular:

The degradation data have been widely applied in reliability analysis for deteriorating systems. However, the degradation data are usually contaminated by measurement errors that can severely... View More

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