IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel Photovoltaic Micro Crack Detection Technique

Author(s): Mahmoud Dhimish ; Violeta Holmes ; Peter Mather
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2574
ISSN (Paper): 1530-4388
DOI: 10.1109/TDMR.2019.2907019
Regular:

This paper presents a novel detection technique for inspecting solar cells micro cracks. Initially, the solar cell is captured using Electroluminescence (EL) method, then processed by the proposed... View More

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