IEEE - Institute of Electrical and Electronics Engineers, Inc. - Blind Group Testing

Author(s): Wasim Huleihel ; Ohad Elishco ; Muriel Medard
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9654
ISSN (Paper): 0018-9448
DOI: 10.1109/TIT.2019.2906607
Regular:

The main goal in group testing is to recover a small subset of defective items from a larger population, while ef?ciently reducing the total number of (possibly noisy) required tests/measurements.... View More

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