IEEE - Institute of Electrical and Electronics Engineers, Inc. - Classification of Manufacturing Defects in Multicrystalline Solar Cells With Novel Feature Descriptor

Author(s): Binyi Su ; Haiyong Chen ; Yifan Zhu ; Weipeng Liu ; Kun Liu
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2900961
Regular:

The automatic defect recognition for near-infrared electroluminescence images is a challenging task, due to the random shape of the crystal grains and intensity variation in the appearance of... View More

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