IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of Microwave Probes on Calibrated On-Wafer Measurements

Author(s): Gia Ngoc Phung ; Franz Josef Schmuckle ; Ralf Doerner ; Bernhard Kahne ; Thomas Fritzsch ; Uwe Arz ; Wolfgang Heinrich
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 9
ISSN (Electronic): 1557-9670
ISSN (Paper): 0018-9480
DOI: 10.1109/TMTT.2019.2903400
Regular:

On-wafer probing with ground-signal-ground (GSG) probes contributes a variety of side effects, which are related to the measured line type, the carrier material, the layout with the... View More

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