IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random Walks for Pansharpening in Complex Tight Framelet Domain

Author(s): Jingkai Wang ; Xiaoyuan Yang ; Ridong Zhu
Sponsor(s): IEEE Geoscience and Remote Sensing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Electronic): 1558-0644
ISSN (Paper): 0196-2892
DOI: 10.1109/TGRS.2019.2897010
Regular:

In this paper, a new random walk (RW) pansharpening method on the basis of the complex framelet domain is proposed. In the process of fusion, the hidden Markov tree model is first established... View More

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