IEEE - Institute of Electrical and Electronics Engineers, Inc. - Program State Sensitive Parallel Fuzzing for Real World Software

Author(s): Jiaxi Ye ; Bin Zhang ; Ruilin Li ; Chao Feng ; Chaojing Tang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2905744
Regular:

Fuzz testing is a widely used technique for software vulnerability detection, but it is still limited in finding bugs nested in the deep program states. Parallel testing is an augmented method... View More

Advertisement