IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scanning Near-field Fluorescence Microscopy Applied to ESEM

Author(s): Ping Gong ; Huixia Yang ; Hui Gao ; Banghong Zhang ; Liang Xie
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2019.2904758
Regular:

A scanning near-field fluorescence microscopy for in-situ test is demonstrated in this paper. The scanning near-field fluorescence microscopy can be applied to commercial Environmental Scanning... View More

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