IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inferring Full Diffusion History from Partial Timestamps

Author(s): Zhen Chen ; Hanghang Tong ; Lei Ying
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3865
ISSN (Electronic): 1558-2191
ISSN (Paper): 1041-4347
DOI: 10.1109/TKDE.2019.2905210
Regular:

Understanding diffusion processes in networks has emerged as an important research topic because of its wide range of applications. Analysis of diffusion traces can help us answer important... View More

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