IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity

Author(s): Fei Wang ; Albert J. P. Theuwissen
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Volume: 66
Page(s): 930 - 940
ISSN (Electronic): 1558-0806
ISSN (Paper): 1549-8328
DOI: 10.1109/TCSI.2018.2872627
Regular:

In this paper, different methodologies are employed to improve the linearity performance of a prototype CMOS image sensor (CIS). First, several pixel structures, including a novel pixel design... View More

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