IEEE - Institute of Electrical and Electronics Engineers, Inc. - 3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition

Author(s): Yoshiaki Deguchi ; Toshiki Nakamura ; Atsuna Hayakawa ; Ken Takeuchi
Sponsor(s): IEEE Solid-State Circuits Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Electronic): 1558-173X
ISSN (Paper): 0018-9200
DOI: 10.1109/JSSC.2019.2900866
Regular:

This paper proposes Value-Aware solid-state drive (SSD) with fast access speed and low power consumption by eliminating error-correcting code (ECC). Value-Aware SSD utilizes the error tolerance of... View More

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