IEEE - Institute of Electrical and Electronics Engineers, Inc. - System Test Architecture Evaluation: A Probabilistic Modeling Approach

Author(s): Mahmoud Efatmaneshnik ; Shraga Shoval ; Keith Joiner
Sponsor(s): IEEE Systems Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (CD): 2373-7816
ISSN (Electronic): 1937-9234
ISSN (Paper): 1932-8184
DOI: 10.1109/JSYST.2019.2899697
Regular:

In this paper, we study the effects of testing architecture on system quality using a probabilistic model of unit testing. The Markovian view of the testing process relates unit quality and test... View More

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