IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Your Self-Driving Algorithm: An Overview of Publicly Available Driving Datasets and Virtual Testing Environments

Author(s): Yue Kang ; Hang Yin ; Christian Berger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2379-8904
ISSN (Paper): 2379-8858
DOI: 10.1109/TIV.2018.2886678
Regular:

Many companies aim for delivering systems for autonomous driving reaching out for SAE Level-5. As these systems run much more complex software than typical premium cars of today, a thorough... View More

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