IEEE - Institute of Electrical and Electronics Engineers, Inc. - Centralized Large Margin Cosine Loss for Open-set Deep Palmprint Recognition

Author(s): Dexing Zhong ; Jinsong Zhu
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2205
ISSN (Paper): 1051-8215
DOI: 10.1109/TCSVT.2019.2904283
Regular:

As one promising branch of biometrics, palmprint recognition has received significant attention and made extraordinary progress in the past decades. The crucial step of palmprint recognition is to... View More

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