IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Coupled Dense Convolutional Network with Complementary Data for Intelligent Fault Diagnosis

Author(s): Jinyang Jiao ; Ming Zhao ; Jing Lin ; Chuancang Ding
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9948
ISSN (Paper): 0278-0046
DOI: 10.1109/TIE.2019.2902817
Regular:

In recent years, artificial intelligent techniques have been extensively explored in the field of health monitoring and fault diagnosis due to their powerful capabilities. In this paper, we... View More

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