IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Event-driven AR-process Model for EEG-based BCIs with Rapid Trial Sequences

Author(s): Paula Gonzalez-Navarro ; Yeganeh M. Marghi ; Bahar Azari ; Murat Akcakaya ; Deniz Erdogmus
Sponsor(s): IEEE Engineering In Medicine and Biology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-0210
ISSN (Paper): 1534-4320
DOI: 10.1109/TNSRE.2019.2903840
Regular:

Electroencephalography (EEG) is an effective noninvasive measurement method to infer user intent in braincomputer interface (BCI) systems for control and communication, however these... View More

Advertisement