IEEE - Institute of Electrical and Electronics Engineers, Inc. - A NIST perspective on metrology and EMC challenges for 5G and beyond

Author(s): Perry F. Wilson ; Kate A. Remley ; William F. Young ; Camillo A. Gentile ; John M. Ladbury ; Dylan F. Williams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2018
Volume: 7
Page(s): 77 - 85
ISSN (Electronic): 2162-2272
ISSN (Paper): 2162-2264
DOI: 10.1109/MEMC.2018.8637299
Regular:

Wireless connectivity, the internet of things, smart technologies and applications will all create new EMC challenges, in both expected and unexpected forms. Traceable metrology needs to be... View More

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