IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Model-Assisted Probability of Detection Study on Induction Thermography Technique

Author(s): B. Azzabi Zouraq ; H. K. Bui ; A. Peterzol ; G. Wasselynck ; G. Berthiau ; D. Trichet ; M. Taglione
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 4
ISSN (Electronic): 1941-0069
ISSN (Paper): 0018-9464
DOI: 10.1109/TMAG.2019.2898733
Regular:

In this paper, one proposes a model-assisted probability of detection approach to study the reliability of detecting special defects. The approach is based on a 3-D finite-element T-$Ω $... View More

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