IEEE - Institute of Electrical and Electronics Engineers, Inc. - Logistic Regression Confined by Cardinality-Constrained Sample and Feature Selection

Author(s): Ehsan Adeli ; Xiaorui Li ; Dongjin Kwon ; Yong Zhang ; Kilian Pohl
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2160-9292
ISSN (Electronic): 1939-3539
ISSN (Paper): 0162-8828
DOI: 10.1109/TPAMI.2019.2901688
Regular:

Many vision-based applications rely on logistic regression for embedding classification within a probabilistic context, such as recognition in images and videos or identifying disease-specific... View More

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