IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust ConvNet Landmark-Based Visual Place Recognition by Optimizing Landmark Matching

Author(s): Yaguang Kong ; Wei Liu ; Zhangping Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2901984
Regular:

Visual place recognition (VPR) is a fundamental but challenging problem that has not been solved completely for a long time, especially in a kaleidoscopic environment. Recent advanced works which... View More

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